Design for Testability (DFT) Design Services
Empowering Silicon with Test-Ready Innovation
Comprehensive DFT solutions for ASICs: scan, ATPG, MBIST, JTAG, and more. 15+ tape-outs. Automotive, IoT, networking, consumer.
Meet the DFT Team
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DFT Lead Engineer
20+ years
Full-chip DFT strategy, sign-off, and integration into physical design flows.
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Senior DFT Engineer
5โ8 years
Scan synthesis, pattern generation, MBIST insertion, STA closure for test logic.
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Junior Engineer
2โ4 years
Verification, rule-check cleanup, and support under senior supervision.
DFT Service Offerings
Full test architecture aligned with chip goals:
- Scan-based testing (insertion & compression)
- Memory BIST (March C, March C-, transparent BIST)
- JTAG (IEEE 1149.1), boundary scan
- LBIST, test point insertion
- In-System Test (IST), On-Chip Debug (OCD)
DFT Tools & Technologies
DFT Compiler
Synopsys DFT Compiler
Modus
Cadence Modus
Tessent
Siemens Tessent
DFTMAX
Synopsys DFTMAX
ScanPro
Tessent ScanPro
Genus
Cadence Genus with Modus
TetraMAX
Synopsys TetraMAX
ATPG
Siemens Tessent ATPG
FastScan
FastScan
STAR Memory
Synopsys STAR Memory System
MBIST
Tessent MBIST, Cadence MBIST
VCS
Synopsys VCS
Questa
Siemens Questa
NC-Sim
Cadence NC-Sim
SpyGlass
SpyGlass DFT
Conformal
Conformal
PrimeTime
PrimeTime
TCL
TCL Scripting
Python
Python Scripting
Perl
Perl Scripting
ODC Model for DFT & Test IP Development
Secure VPNRemote infrastructure
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EDA ToolsLicensed access
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NDA & ISOData security
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ReportingWeekly & daily
Ideal for JTAG TAP, custom test wrappers, LBIST/MBIST logic & more
Why Choose Us?
30+Tape-outs with robust DFT architecture
Full-stackDFT tool support: Synopsys, Cadence, Tessent
FlexibleFull-flow or task-based DFT services
50โ60% Savedvs. local teams
Long-TermYour trusted DFT partner